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Numerical calculation in the far electric fields E caused by vertical lightning return strokes to the flat ground on conventional methods
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Released in Jan. 2018, PDF, pages 17

An author: Hiroshi Kurita
Education on the author
-Apr. 1980-Mar. 1984
-Electrical engineering faculty Waseda University
-Graduated from electrical engineering major in Mar. 1984
-Feb. 1998
-Ph.D. in Waseda University on electrical engineering

Keywords: numerical calculation, far electric fields E, potential φ, vector potential A, intrinsic dynamic volume charge density ρv, equivalent volume charge density ρveq, intrinsic dynamic conductive current density jc, basic relation between intrinsic dynamic volume charge density ρv and intrinsic dynamic conductive current density jc, the special theory of relativity, modeling of vertical lightning return strokes to the flat ground, velocity of lightning return strokes to the earth v, waveforms of lightning return strokes to the earth 10/350 μs, 1/200 μs and 0.25/100 μs

Sequel to “Numerical calculation in the middle electric fields E caused by vertical lightning return strokes to the flat ground on conventional methods, Technical meeting on high voltage engineering, IEE Japan, HV-15-054, pp.57-74, Feb. 2015.” and “Numerical calculation in the neighbouring electric fields E caused by vertical lightning return strokes to the flat ground on conventional methods, Technical meeting on high voltage engineering, IEE Japan, HV-13-081, pp.67-84, Nov. 2013.”

The technical comprehension of this paper is helped by the conclusions on the timing analysis in “Numerical calculation in waveforms in the extremely far electric fields E caused by vertical lightning return strokes to the flat ground of downward flashes on conventional methods -Effect on length in wave tails in scalar conductive currents in vertical lightning return strokes to the flat ground of downward flashes Lwt et al.-, 28th Annual conference of power & energy society, IEE of Japan, Tokyo Japan, 45, pp.9-3-17-pp.9-3-30, Sep. 2017.”

The author doesn’t take any responsibility for contents of this paper.